Agenda
Texas-Wisconsin Model and Control Consortium (TWMCC)
Hosted by
Department of Chemical Engineering
University of Texas, Austin, TX 78712
February 10 – 11, 2003
ACES Building – Room 6.304
24th and Speedway
Monday, February 10, 2003
ACES Building -Room 6.304
| 8:30 a.m. | Coffee and Donuts | |
| 9:00 | Introduction/Review of Agenda/ 10 year Retrospective of TWMCC |
T. Edgar |
| 9:15 | PI Overviews | T. Edgar J. Qin J. Rawlings |
| 10:00 | OptQuest/NLP: New Multistart Global Optimization Software for MINLP Problems | L. Lasdon |
| 10:30 | Break | |
| 11:00 | Large-scale MPC | A. Venkat |
| 11:30 | Lunch – O's dining room | |
| 1:00 p.m. | Process Control at Mitsubishi | M. Ogawa / H. Douke |
| 2:00 | Discussion Group Breakouts (state estimation, process monitoring) |
J.
Rawlings J. Qin |
| 2:45 | Break | |
| 3:00 | TICAM Overview | T. Oden |
| 3:30 | Control of Electrical Properties of Semiconductors | R. Good |
| 4:00 | Poster Session | |
| 5:30 | Adjourn | |
| 6:30 | Mixer/dinner – County Line on the Lake, 5204 FM 2222 | |
Poster Session
| University of Texas - Austin | |
| PCA Analysis of Etcher Data for Fault Detection | B. Bregenzer |
| Diagnostic Modeling of Plasma Etching | K. Chamness |
| Semiconductor Batch Process Monitoring Using Multiblock PCA | G. Cherry |
| Combined Real-time and Run-to-run Control Technique with Independent Tuning | I. Chin |
| The Control of Electrical Properties of Semiconductors | R. Good |
| Obtaining and Using Qualitative Information about Process Optima | E. Hale |
| Multi-Step Supervisory Control of Flash Memory Device Production Via a simple First-Principles Model | C. Harrison |
| Benchmarking Performance for Run to Run Controller Selection | S. Harrison |
| Computationally Efficient Modeling of Wafer Temperatures in an LPCVD Furnace | P. He |
| Reactive Distillation Modeling | S. Lextrait |
| Faulty Sensors Diagnosis with Optimal Structured Residuals | W. Lin |
| Benchmarking Performance for Run to Run Controller Selection | L. Rueda |
| Embedded Large scale MPC Software Development | D. Thiele |
| EWMA, Kalman Filter and Recursive Least Squares - relationships and modifications | J. Wang |
| University of Wisconsin - Madison | |
| Communication - Based Decentralized MPC | A. Venkat |
Tuesday, February 11, 2003
ACES Building -Room 6.304
| 8:15 a.m. | Continental breakfast – Meeting with PI's and Sponsors | |
| 9:00 | Optimal Sensor Selection | K. Muske |
| 9:30 | Reactive Distillation Modeling | S. Lextrait |
| 10:00 | Pilot Plant Testing of Reactive Distillation | L. Rueda |
| 10:15 | Break | |
| 10:30 | Dynamic Models of Human Disease: What Are They and Why Are They Important? | J. Bosley |
| 11:00 | Computationally Efficient Modeling of Wafer Temperatures in a LPCVD Furnace | P. He |
| 11:20 | EWMA, Kalman Filtering, and Recursive Least Squares - Relationships and Modifications | J. Wang |
| 11:45 | Wrap Up | |
| 12:00 | Adjourn | |